|ITEM METADATA RECORD
|Title: ||Improved model to determine the generation lifetime in short channel SOI nMOSFETS|
|Authors: ||Galeti, M ×|
Claeys, Corneel #
|Issue Date: ||2007 |
|Host Document: ||pages:387-392|
|Conference: ||Silicon-on-Insulator Technology and Devices 13 location:Brazil date:06/05/07|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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