ITEM METADATA RECORD
Title: Simple analytical model to study the STC bias point in FinFETs
Authors: Bellodi, M ×
Camillo, L.M
Martino, J.A
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2007
Publisher: ECS
Host Document: pages:205-209
Conference: Silicon-on-Insulator Technology and Devices 13 location:Brazil date:06/05/07
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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