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Title: Reliable two-dimensional carrier profiling by scanning spreading resistance microscopy on InP-based devices with fast quantification procedure
Authors: Xu, Mingwei ×
Eyben, Pierre
Hantschel, Thomas
Vandervorst, Wilfried #
Issue Date: Feb-2002
Publisher: Publication Board, Japanese Journal of Applied Physics
Series Title: Japanese Journal of Applied Physics 1, Regular Papers, Short Notes & Review Papers vol:41 issue:2B pages:1048-1054
ISSN: 0021-4922
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Solid State Physics and Magnetism Section
× corresponding author
# (joint) last author

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