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Title: Three-dimensional carrier profiling of InP-based devices using scanning spreading resistance microscopy
Authors: Xu, Mingwei ×
Hantschel, Thomas
Vandervorst, Wilfried #
Issue Date: 2002
Series Title: Applied Physics Letters vol:81 issue:1 pages:177-179
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Solid State Physics and Magnetism Section
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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