Title: Electrical and reliability characterization of metal-gate/HfO2/Ge FET’s with Si passivation
Authors: Kaczer, Ben ×
De Jaeger, Brice
Nicholas, Gareth
Martens, Koen
Degraeve, Robin
Houssa, Michel
Pourtois, Geoffrey
Leys, Frederik
Meuris, Marc
Groeseneken, Guido #
Issue Date: Sep-2007
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:84 issue:9-10 pages:2067-2070
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Electrical Engineering - miscellaneous
Semiconductor Physics Section
× corresponding author
# (joint) last author

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