|ITEM METADATA RECORD
|Title: ||Toward understanding the wide distribution of time scales in negative bias temperature instability|
|Authors: ||Kaczer, Ben ×|
Groeseneken, Guido #
|Issue Date: ||2007 |
|Host Document: ||pages:265-282|
|Conference: ||Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9 location:Leuven Belgium date:06/05/07|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
× corresponding author|
# (joint) last author|
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