Title: Toward understanding the wide distribution of time scales in negative bias temperature instability
Authors: Kaczer, Ben ×
Grasser, Tibor
Fernandez, Raul
Groeseneken, Guido #
Issue Date: 2007
Publisher: ECS
Host Document: pages:265-282
Conference: Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9 location:Leuven Belgium date:06/05/07
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.