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Title: Significance of the failure criterion on transmission line pulse testing
Authors: Keppens, Bart ×
De Heyn, Vincent
Mahadeva Iyer, Natarajan
Vassilev, Vesselin
Groeseneken, Guido #
Issue Date: 2002
Series Title: Microelectronics Reliability vol:42 issue:6 pages:901-907
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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