ITEM METADATA RECORD
Title: Frequency dependence in interline capacitance measurements
Authors: Stucchi, Michele ×
Maex, Karen #
Issue Date: 2002
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Instrumentation and Measurement vol:51 issue:3 pages:537-543
ISSN: 0018-9456
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science