Title: Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
Authors: Martens, Koen ×
Wang, Wenfei
De Keersmaecker, K
Borghs, Gustaaf
Groeseneken, Guido
Maes, Herman #
Issue Date: 2007
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:84 issue:9-10 pages:2146-2149
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Physics and Astronomy - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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