Title: Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation
Authors: Poortmans, Jef ×
Vermeulen, Tom
Nijs, Johan
Mertens, Robert #
Issue Date: 1996
Host Document: pages:721-724
Conference: Conference Record of the 25th IEEE Photovoltaic Specialists Conference; May 13-17, 1996; Washington, D.C., USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - ELECTA, Electrical Energy Computer Architectures
× corresponding author
# (joint) last author

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