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Title: A 2-D analytical threshold voltage model for fully-depleted SOI MOSFETs with halos or pockets
Authors: Van Meer, Hans ×
De Meyer, Christina #
Issue Date: 2001
Series Title: IEEE Transactions on Electron Devices vol:48 issue:10 pages:2292-2302
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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