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Title: Two-dimensional model for the threshold slope in deep-submicron fully-depleted SOI MOSFET's
Authors: Van Meer, Hans ×
De Meyer, Christina #
Issue Date: 2001
Host Document: pages:238-241
Conference: Proceedings of the SISPAD Conference; Athens, Greece.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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