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Title: A comparison of extraction techniques for threshold voltage mismatch
Authors: Croon, Jeroen ×
Tuinhout, Hans
Difrenza, R
Knol, J
Moonen, A.J
Decoutere, Stefaan
Maes, Herman
Sansen, Willy #
Issue Date: 2002
Host Document: pages:235-240
Conference: International Conference on Microelectronic Test Structures location:Leuven Belgium date:08/04/02
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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