Title: Defectivity study of Cu metallization by dark and bright field inspection
Authors: Carbonell, Laure
Holsteyns, Frank
Tokei, Zsolt
O'Reilly, Lisa
Maex, Karen
Mertens, Paul
Issue Date: 2002
Conference: UCPSS - Ultra Clean Processing Technology Symposium location:Leuven Belgium date:16/09/02
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.