ITEM METADATA RECORD
Title: CMOS scaling to 25nm gate lengths
Authors: Kubicek, Stefan ×
De Meyer, Christina #
Issue Date: 2002
Host Document: pages:259-270
Conference: Proceedings of the 4th International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM location:Leuven Belgium date:14/10/02
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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