Title: Investigation of performance improvement and gate-to-junction leakage reduction fot the 90nm CMOS gate stack architecture
Authors: Henson, Kirklen ×
Kubicek, Stefan
Redolfi, Augusto
De Meyer, Christina
Jurczak, Malgorzata
Augendre, Emmanuel #
Issue Date: 2002
Publisher: University of Bologna
Host Document: pages:563-566
Conference: ESSDERC - 32nd European Solid-State Device Research Conference location:Leuven Belgium date:24/09/02
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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