Title: The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes
Authors: Rotondaro, Antonio ×
Vandamme, Ewout
Vanhellemont, Jan
Simoen, Eddy
Heyns, Marc
Claeys, Cor #
Issue Date: 1996
Series Title: Diffusion and Defect Data. B: Solid State Phenomena vol:47-48 pages:397-402
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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