Title: Simulation study for the CDM ESD behaviour of the grounded-gate nMOS
Authors: Russ, Christian ×
Verhaege, K
Bock, Karlheinz
Groeseneken, Guido
Maes, Herman #
Issue Date: 1996
Series Title: Microelectronics Reliability vol:36 pages:1739-1742
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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