Title: A compact model for the grounded-gate nMOS behaviour under CDM ESD stress
Authors: Russ, Christian ×
Verhaege, K
Bock, Karlheinz
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1996
Host Document: pages:302-315
Conference: Proceedings of 18th Annual Electrical Overstress/Electrostatic Discharge Symposium; 10-12 September 1996; Orlando, FL, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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