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Title: Noise and THI reliability indicators for thin film resistors
Authors: Sikula, J ×
Hruska, P
Vasina, Petr
Schauer, P
Lolarova, R
Hajek, K
Stadalnikas, A
Palenskis, V
Claeys, Cor
Simoen, Eddy #
Issue Date: 1996
Host Document: pages:200-5
Conference: Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium; 7-11 Oct. 1996; Nice, France.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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