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|ITEM METADATA RECORD
|Title: ||Noise and THI reliability indicators for thin film resistors|
|Authors: ||Sikula, J ×|
Simoen, Eddy #
|Issue Date: ||1996 |
|Host Document: ||pages:200-5|
|Conference: ||Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium; 7-11 Oct. 1996; Nice, France.|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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