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Title: Gate length effect on the RTS noise amplitude in SOI MOSFETs
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1996
Series Title: IEEE Electron Device Letters vol:17 pages:181-183
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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