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Title: Empirical 1/f noise model for polysilicon emitter bipolar junction transistors
Authors: Simoen, Eddy ×
Decoutere, Stefaan
Deferm, Ludo
Claeys, Cor #
Issue Date: 1996
Host Document: pages:3-8
Conference: proceedings 3rd ELEN Workshop; 5-6 November 1996; Leuven, Belgium. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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