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Title: Extended defect related excess low-frequency noise in Si junction diodes
Authors: Simoen, Eddy ×
Vanhellemont, Jan
Bosman, Gijs
Czerwinsky, A
Claeys, Cor #
Issue Date: 1996
Host Document: pages:133-8
Conference: Defect Recognition and Image Processing in Semiconductors 1995. Proceedings of the Sixth International Conference; 3-6 Dec. 1995 location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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