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Title: Low-frequency noise sources related to processing-induced extended defects in Si devices
Authors: Simoen, Eddy ×
Vanhellemont, Jan
Claeys, Cor #
Issue Date: 1996
Series Title: Diffusion and Defect Data. B: Solid State Phenomena vol:47-48 pages:403-408
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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