|ITEM METADATA RECORD
|Title: ||Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers|
|Authors: ||Tavares, J ×|
Maex, Karen #
|Issue Date: ||1996 |
|Series Title: ||Thin Solid Films vol:277 pages:90-97|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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