Title: Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers
Authors: Tavares, J ×
Bender, Hugo
Maex, Karen #
Issue Date: 1996
Series Title: Thin Solid Films vol:277 pages:90-97
ISSN: 0040-6090
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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