Title: Hole trapping and trap generation in the gate silicon dioxide
Authors: Zhang, Jenny ×
Sii, H. K
Groeseneken, Guido
Degraeve, Robin #
Issue Date: 2001
Series Title: IEEE Transactions on Electron Devices vol:48 issue:6 pages:1127-1135
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science