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Title: Relation between hole traps and non-reactive hydrogen induced positive charges
Authors: Zhang, Jianjun ×
Zhao, C.D
Groeseneken, Guido
Degraeve, Robin
Ellis, J. N
Beech, C. D #
Issue Date: 2001
Series Title: Microelectronic Engineering vol:59 issue:01/04/07 pages:67-72
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Laboratory of Clinical and Epidemiological Virology (Rega Institute)
Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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