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Title: Electrical characterization of silicon-rich-oxide-based memory cells using pulsed current-voltage techniques
Authors: Rosmeulen, Maarten ×
Sleeckx, Erik
De Meyer, Christina #
Issue Date: 2002
Publisher: University of Bologna
Host Document: pages:471-474
Conference: ESSDERC - 32nd European Solid-State Device Research Conference location:Leuven Belgium date:24/09/02
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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