|ITEM METADATA RECORD
|Title: ||Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices|
|Authors: ||Nicolett, A.S ×|
Claeys, Corneel #
|Issue Date: ||2002 |
|Series Title: ||Solid-State Electronics vol:46 issue:9 pages:1381-1387|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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