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Title: Layout impact on the performance of a locally strained PMOSFET
Authors: Eneman, Geert ×
Verheyen, Peter
Rooyackers, Rita
Nouri, Faran
Washington, Lori
Degraeve, Robin
Kaczer, Ben
Moroz, Victor
De Keersgieter, An
Schreutelkamp, Rob
Kawaguchi, M
Kim, Y
Samoilov, A
Smith, L
Absil, Philippe
De Meyer, Christina
Jurczak, Malgorzata
Biesemans, Serge #
Issue Date: 2005
Publisher: IEEE
Host Document: pages:22-23
Conference: Symposium on VLSI Technology. Digest of Technical Papers location:Leuven Belgium date:14/06/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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