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|ITEM METADATA RECORD
|Title: ||Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments|
|Authors: ||Vanhellemont, Jan ×|
Claeys, Cor #
|Issue Date: ||1996 |
|Series Title: ||Diffusion and Defect Data. B: Solid State Phenomena vol:47-48 pages:229-234|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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