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Title: A low-frequency noise study of the physical hot-carrier degradation mechanisms in lowly-doped-drain Si MOSFETs
Authors: Vasina, Petr
Simoen, Eddy
Sikula, J
Claeys, Cor
Issue Date: 1996
Conference: Belgische natuurkundige vereniging. Algemene wetenschappelijke vergadering.; 6-7 June 1996; Brussel, Belgium.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

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