Title: Is the constant current charge-to-breakdown method still a good tool to measure oxide reliability
Authors: Nigam, Tanya
Degraeve, Robin
Groeseneken, Guido
Heyns, Marc
Issue Date: 1997
Conference: SISC-Conference; December 1997; Charleston, South-Carolina, USA.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Department of Materials Engineering - miscellaneous

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