ITEM METADATA RECORD
Title: Gate voltage dependence of reliability for ultra-thin oxides
Authors: Nigam, Tanya
Depas, Michel
Degraeve, Robin
Heyns, Marc
Groeseneken, Guido #
Issue Date: 1997
Conference: Proceedings Solid State Devices and Materials Conference (SSDM); Hamamatsu, Japan. September 1997.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Department of Materials Engineering - miscellaneous
# (joint) last author

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