Title: Electron trap generation at different temperatures in the gate oxide
Authors: Zhang, W.D
Zhang, J.F
Wood, M
Lalor, M
Burton, D
Groeseneken, Guido
Degraeve, Robin
Issue Date: 2002
Conference: 33rd IEEE Semiconductor Interface Specialists Conference - SISC date:05/12/02
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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