Title: Generation of hole traps in oxides under high field stresses
Authors: Zhao, Chao
Zhang, J.F
Groeseneken, Guido
Degraeve, Robin
Issue Date: 2002
Conference: 33rd IEEE Semiconductor Interface Specialists Conference - SISC location:Leuven Belgium date:05/12/02
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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