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Title: The influence of the package environment on the functioning and reliability of RF-MEMS switches
Authors: van Spengen, Merlijn ×
Czarnecki, Piotr
Puers, Robert
van Beek, Joost T.M
De Wolf, Ingrid #
Issue Date: 2005
Publisher: IEEE
Host Document: pages:337-341
Conference: 43rd Annual IEEE International Reliability Physics Symposium Proceedings location:Leiden The Netherlands date:17/04/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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