Title: The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability
Authors: Witvrouw, Ann
Van Dooren, Sofie
Wouters, D
Van Dievel, Marc
Maex, Karen #
Issue Date: 1996
Series Title: Microelectronics Reliability vol:36 pages:1847-1850
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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