|ITEM METADATA RECORD
|Title: ||Influence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors|
|Authors: ||Wouters, D. J ×|
Maes, Herman #
|Issue Date: ||1996 |
|Series Title: ||Microelectronics Reliability vol:36 pages:1763-1766|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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