Title: Influence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors
Authors: Wouters, D. J ×
Maes, Herman #
Issue Date: 1996
Series Title: Microelectronics Reliability vol:36 pages:1763-1766
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science