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Title: Hot-carrier stress effects on the amplitude of random telegraph signals in small area Si p-MOSFETs
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1997
Series Title: Microelectronics Reliability vol:37 pages:1015-1019
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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