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Title: Impact ionization related phenomena in Si MOSFETs operating at cryogenic temperatures
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1997
Host Document: pages:117-139
Conference: Proceedings of the 4th Symposium on Low Temperature Electronics and High Temperature Superconductivity; location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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