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Title: Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFET's
Authors: Simoen, Eddy ×
Vasina, Petr
Sikula, J
Claeys, Cor #
Issue Date: 1997
Series Title: IEEE Electron Device Letters vol:18 pages:480-482
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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