Title: Test structure to investigate the series resistance components of source/drain structure
Authors: Biesemans, Serge ×
Kubicek, Stefan
De Meyer, Kristin #
Issue Date: 1997
Series Title: IEEE Electron Device Letters vol:18 pages:477-479
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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