|ITEM METADATA RECORD
|Title: ||Test structure to investigate the series resistance components of source/drain structure|
|Authors: ||Biesemans, Serge ×|
De Meyer, Kristin #
|Issue Date: ||1997 |
|Series Title: ||IEEE Electron Device Letters vol:18 pages:477-479|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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