Title: Process and device design influence on the ESD performance of a fully silicided 0.25mm CMOS technology
Authors: Bock, Karlheinz ×
Russ, Christian
Badenes, Gonçal
Groeseneken, Guido
Deferm, Ludo #
Issue Date: 1997
Host Document: pages:129-137
Conference: Proceedings of the ESD Forum; Berlin, October 1997. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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