|ITEM METADATA RECORD
|Title: ||Trends in the oxygen enhancement of the ionisation probabilities of elements sputtered from Si|
|Authors: ||Janssens, Tom|
|Issue Date: ||2002 |
|Conference: ||3rd European Workshop on Secondary Ion Mass Spectrometry - SIMS Europe location:Leuven Belgium date:15/09/02|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Nuclear and Radiation Physics Section|
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