Title: Trends in the oxygen enhancement of the ionisation probabilities of elements sputtered from Si
Authors: Janssens, Tom
Huyghebaert, Cedric
Vandervorst, Alain
Issue Date: 2002
Conference: 3rd European Workshop on Secondary Ion Mass Spectrometry - SIMS Europe location:Leuven Belgium date:15/09/02
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Nuclear and Radiation Physics Section

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