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Title: Electrical and structural properties of oxygen-precipitation induced extended defects in silicon
Authors: Claeys, Cor ×
Simoen, Eddy
Vanhellemont, Jan #
Issue Date: 1997
Series Title: Journal de Physique III vol:7 pages:1469-1486
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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