Title: A yield-aware modeling methodology for nano-scaled SRAM designs
Authors: Grossar, Evelyn ×
Croon, Jeroen
Stucchi, Michele
Dehaene, Wim
Maex, Karen #
Issue Date: 2005
Conference: International Conference on Integrated Circuit Design & Technology location:Austin USA date:09/05/05
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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