Title: Quantification of B and As depth profiles with resonant post-ionisation mass spectrometry
Authors: De Bisschop, Peter ×
Gomez, Jose Ignacio
Vandervorst, Wilfried #
Issue Date: 1997
Host Document: pages:793-6
Conference: Secondary Ion Mass Spectrometry - SIMS X : Proceedings of the 10th International Conference on Secondary Ion Mass Spectrometry; location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.