Title: Reliable 5.9nm tunnel oxide flash EEPROM device
Authors: De Blauwe, Jan
Van Houdt, Jan
Wellekens, Dirk
Haspeslagh, Luc
Groeseneken, Guido
Maes, Herman
Issue Date: 1997
Conference: 15th IEEE Non -Volatile Semiconductor Workshop (NVSM) ; February 1997; Monterey, Calif., USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems

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