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Title: Shrinking from 0.25 µm down to 0.12 µm SOI CMOS technology node: a contribution to 1/f noise in partially depleted n-MOSFETs
Authors: Dieudonné, F ×
Haendler, S
Jomaah, J
Raynaud, C
De Meyer, Christina
Van Meer, Hans
Balestra, F #
Issue Date: 2002
Host Document: pages:33-36
Conference: Proceedings Ultimate Integration of Silicon (ULIS) Workshop date:07/03/02
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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